Atomic Force Microscopy (AFM) is a powerful technique that enables the imaging and manipulation of individual atoms and molecules on a surface with nanometer resolution. It works by scanning a sharp probe tip over a sample surface while measuring the interaction between the tip and the surface. AFM can provide detailed information about surface topography, mechanical properties, and chemical composition at the nanoscale level. It is widely used in various fields such as materials science, nanotechnology, biology, and physics for studying surface structures, characterizing materials, and investigating molecular interactions. Overall, AFM offers researchers a versatile and high-resolution tool for studying surfaces and materials at the atomic and molecular level.